NI TestStand

Piscitello, A., Neag, I., "Top 10 Development Tips and Tricks for NI TestStand", presentation at NI Week 2007


Lindstrom, L., Neag. I.A., “Reducing Test Program Costs Through ATML-based equirements Conversion and Code Generation”, Proc. AUTOTESTCON, Schaumburg, IL, 2013. © IEEE. (View)

Neag, I., "Quickly Translating Test Specifications Into Test Programs Through ATML", presentation at NI Week 2012

Neag. I.A., Seavey, M., “Applications of IEEE P1671.1 ATML Test Description”, Proc. AUTOTESTCON, Baltimore, MD, 2007. © IEEE. (View)

Neag, I.A., Gal, S., Hartop, D., “Data Type Extensibility in Automatic Test Systems”, Proc. AUTOTESTCON, Huntsville, AL, 2002 (In IEEE Xplore)

Signal Interface

These papers describe the design of a signal-oriented instrument control interface. Although the standard referenced in the papers did not materialize, you may still find useful ideas for the design of a signal-oriented Hardware Abstraction Layer (HAL).

Ramachandran, N., Oblad, R.P., Neag, I.A., Tyler, D.F., “The Role of the IVI Signal Interface Standard in Supporting Instrument Interchangeability”, Proc. AUTOTESTCON, Anaheim, CA, 2000. © IEEE. (View)

Neag, I.A., Ramachandran, N, “ATLAS2K and the IVI Signal Interface - the Framework for an Open, Modular and Distributed ATS Architecture”, Proc. AUTOTESTCON, Valley Forge, PA, 2001. © IEEE. (View)

Gal, S., Neag, I.A., “A Unified Interface for Signal Oriented Control of Instruments and Switches”, Proc. AUTOTESTCON, Huntsville, AL, 2002. © IEEE. (View)

Neag. I.A, Gal, S., “A unified control interface for signal sources, sensors, switches and monitors”, Proc. AUTOTESTCON, Anaheim, CA, 2003. © IEEE. (In IEEE Xplore)

Neag, I.A., Cornish, M., “Implementation Architecture For IEEE Standard P1641 - Signal And Test Definition Using IVI Technologies”, Proc. AUTOTESTCON, San Antonio, TX, 2004. © IEEE. (View)

The papers published by the IEEE are posted here with permission of the IEEE. An author is permitted to post his IEEE copyrighted paper on his personal site and his institution’s server, but only the accepted version of his paper, not the published version as might be downloaded from IEEE Xplore. An accepted manuscript is a version which has been revised by the author to incorporate review suggestions, and which has been accepted by IEEE for publication. By choosing to view these documents, you agree to all provisions of the copyright laws protecting it.


Learn more about ATML on the IEEE Web site

Learn more about ATML on the National Instruments Web site

Find answers to ATML Frequently Asked Questions

Evaluate ATML Pad, a visual editor for ATML offered by Reston Software

Evaluate NI TestStand ATML Toolkit, which contains a translator from the ATML Test Description format into TestStand test programs

Join IEEE SCC20 and participate in the development of Test and Diagnosis standards